Functional testing approaches for "BIFST-able" tlm_fifo

Evolution of Electronic System Level design methodologies, allows a wider use of Transaction-Level Modeling (TLM). TLM is a high-level approach to modeling digital systems that emphasizes on separating communications among modules from the details of functional units. This paper explores different functional testing approaches for the implementation of Built-in Functional Self Test facilities in the TLM primitive channel tlm_fifo. In particular, it focuses on three different test approaches based on a finite state machine model of tlm_fifo, functional fault models, and march tests respectively. Index Terms — Design for Testability (DFT), System Test, Functional Testing, Transaction Level Modeling (TLM), System Level Design